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https://news.cornell.edu/stories/2026/03/electron-microscopy-shows-mouse-bite-defects-semi…

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was the result of a collaboration with Taiwan Semiconductor Manufacturing Company (TSM…

https://engr.source.colostate.edu/csu-biologists-and-engineers-create-genetic-toggle-switc…

CSU biologists and engineers create genetic toggle switch for plants | Walter Scott, Jr. College of Engineering | Colorado State University CSU biologists and engineers create genetic toggle switch for plants By Taryn Bradley and Russell Dickerson May 22, 2025 If you’re one of th…